“ENHANCING TEST AUTOMATION COVERAGE AND EFFICIENCY WITH SELENIUM GRID: A STUDY ON DISTRIBUTED TESTING IN AGILE ENVIRONMENTS”, IJARET, vol. 15, no. 3, pp. 119–127, May 2024, Accessed: Feb. 07, 2026. [Online]. Available: https://iaeme-library.com/index.php/IJARET/article/view/IJARET_15_03_011